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Features and BenefitsSD1024X™
SD1024XH™
SD1024XL™
SD2048XL™
All SD1024X Series Instruments are RoHS Compliant
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Embedded Spectrometer SeriesConsult Verity for availability. Unique in our industry, the SD1024X combines the functionality of a high performance spectrometer and process computer in the same size enclosure as Verity’s standard spectrometers. The SD1024X runs Verity’s SpectraView (version 6.2+) applications software. This is the same software as can be used with an applications computer in support of a traditional (SD1024D, SD1024F, and SD1024G series) spectrometer. > SD1024X™ – High Performance Spectrometer SD1024X™ – High Performance> Request Technical Specifications [PDF]> Contact Sales@VerityInst.com Description: The SD1024X spectrometer is designed for demanding semiconductor process control applications, such as low exposed area contact etch. When coupled with a Verity flashlamp the SD1024X can also be used as a spectral reflectometer for film thickness or depth measurement. The scientific grade CCD features thermoelectric cooling (for low noise) excellent ultraviolet sensitivity, low noise, and wide dynamic range.
Spectrometer SD1024XH™ – Ultra Performance> Request Technical Specifications [PDF]> Contact Sales@VerityInst.com Description: The SD1024XH, a higher performance version of the SD1024X, incorporates very high efficiency optics for superior light throughput (higher signal) and reduced electronics noise.
Spectrometer SD1024XL™ – General Purpose> Request Technical Specifications [PDF]> Contact Sales@VerityInst.com Description: The SD1024XL uses a mid-grade CCD and was designed for general purpose semiconductor process applications.
Spectrometer SD2048XL™ – High Resolution> Request Technical Specifications [PDF]> Contact Sales@VerityInst.com Description: The SD2048XL is nearly identical to the SD1024XL, but reports spectral data in 0.25nm increments instead of 0.5nm increments, as with the SD1024X and SD1024XL. Although the SD2048XL has better resolution than the SD1024XL, its sensitivity is lower as a consequence of the smaller input slit that supports the higher resolution. |
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