Spectral Reflectometer for Film Thickness Measurement

Spectral Reflectometer for Film Thickness Measurement Carrollton, Texas, October 2016 – Verity Instruments, Inc. is pleased to announce the availability of the SP2100 Spectral Reflectometer designed for film thickness measurement for in-situ and in-line applications. The SP2100 includes a high performance spectrometer and Xenon flashlamp. The spectrometer includes a two-dimensional, thermoelectrically cooled CCD array that…

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Verity Instruments Releases New Value Line Spectrometer

For Immediate Release Verity Instruments Releases New Value Line Spectrometer September 2, 2016– Verity Instruments is pleased to announce the release of the SE1024GL- CMOS spectrometer. The SE1024GL- CMOS spectrometer provides a cost effective solution for general purpose applications. As compared the SD1024GL, cost is reduced by the use of simpler packaging, LCD display removal,…

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